SILICON DIOXIDE IS A SUPERIOR INSULATION FOR MICROWAVE CABLE SYSTEMS IN AIRCRAFT, SATELLITE, SUBMARINE, EW,  AND SIGNAL TRANSMISSIONS IN NUCLEAR AND AIRCRAFT APPLICATIONS         

MEASURETECH IS A DESIGNATED WOMAN OWNED, SMALL BUSINESS, LOCATED IN THE LOS ANGELES AREA OF CALIFORNIA. FOR THE PAST 20 YEARS WE HAVE SUPPLIED PRODUCTS DIRECTLY TO THE U.S. GOVERNMENT AND THEIR PRIME CONTRACTORS, FOR VARIOUS TYPES OF EQUIPMENT. 

MEASURETECH HAS SUCCESSFULLY PROVIDED EXISTING PRODUCTS TO THE INDUSTRY FOR OVER TWO DECADES, WHILE DEVELOPING NEW PRODUCTS TO MEET THE CONTINUALLY EXPANDING CHALLENGES OF CURRENT TECHNICAL EVOLUTIONS.

DEVELOPMENT OF SILICON DIOXIDE(SIO2) INSULATED CABLE ASSEMBLY IS NOW COMPLETE.  THIS RF CABLE IS DESIGNED FOR HOSTILE ENVIRONMENTS, BOTH IN HIGH AND LOW TEMPERATURES, WHILE REMAINING ELECTRICALLY STABLE COMPARED TO PTFE DIELECTRICS.  

THE SIO2 DIELECTRIC IS THE PREFERRED CHOICE IN NUCLEAR SIGNAL TRANSMISSION APPLICATIONS WHERE PTFE IS NOT PERMITTED, AND WHERE HIGH INSULATION RESISTANCE IN ELEVATED TEMPERATURE IS A CRITICAL REQUIREMENT.
 

BENEFITS OF SILICON DIOXIDE IN MICROWAVE AND SIGNAL TRANSMISSION APPLICATIONS.


SPECIAL PROCESSING OF SILICON DIOXIDE BY MEASURETECH HAS MADE SILICON DIOXIDE THE MOST IDEAL INSULATION FOR MICROWAVE APPLICATIONS AS COMPARED TO TEFLON AND OTHER TYPES OF INSULATIONS. SOME OF THE ADVANTAGES ARE AS FOLLOWS:

-       PHASE STABILITY AND PHASE TRACKING AS A     FUNCTION OF TEMPERATURE

-       INSERTION LOSS STABILITY AND TRACKING AS A FUNCTION OF TEMPERATURE.

-       FORMING OF THE CABLE WITHOUT DEGRADATION TO ELECTRICAL PROPERTIES.

-       RESISTANCE TO EXTREME TEMPERATURES (-200C TO 900C) EXCLUDING CONNECTORS.

-       SMALL INSULATION RESISTANCE DEGRADATION WHEN EXPOSED TO THE ENVIRONMENT.


HIGH INSULATION RESISTANCE AT HIGH TEMPERATURES MAKES
SILICON DIOXIDE THE ONLY CHOICE FOR SIGNAL TRANSMISSION,
WHERE SIGNAL TO NOISE RATIO BECOMES MOST ESSENTIAL.

MANUFACTURING PROCESS AND MATERIALS.


A HIGH PURITY SILICON DIOXIDE POWDER (99.98%) IS MIXED WITH DE-IONIZED WATER AND EXTRUDED OVER OFHC COPPER CONDUCTOR , THEN LOADED IN OFHC COPPER TUBING.  AFTER SEVERAL DRYING CYCLES THE TUBING IS REDUCED TO COMPACT THE INSULATION, AND ANNEALING OF THE CABLE IS PERFORMED TO COMPLETELY STRESS RELIEF THE CABLE AND TO ALLOW  THE FINAL ASSEMBLY TO BE FORMED TO CUSTOMER SPECIFICATIONS.

THE UNIQUE PROCESS DEVELOPED BY MEASURETECH ALLOWS THE OPTIMUM CHARACTERISTICS OF INSULATION TO BE ACHIEVED, THEREBY A VARIETY OF OUTSIDE JACKETS INCLUDING ALUMINUM CAN BE USED.

EVEN THOUGH MOST OF THE DEVELOPMENT WORK HAS BEEN PERFORMED USING .142 COAXIAL MICROWAVE CABLE UTILIZING COPPER AS AN OUTER CONDUCTOR, ANY TYPE OF MICROWAVE CABLE OR  MULTICONDUCTOR ASSEMBLIES CAN BE EASILY MANUFACTURED USING THE SAME PROCESS WITH DIFFERENT TOOLING.

OUTER JACKET ALSO CAN BE ANY TYPE OF MATERIAL BASED ON APPLICATION, A COMPOSITE COPPER STAINLESS JACKET ALSO CAN BE USED TO     MANUFACTURE MICROWAVE CABLES.

AT THE PRESENT TIME MEASURETECH UTILIZES OFHC COPPER JACKET WHICH IS NICKEL PLATED TO PROTECT THE COPPER FROM OXIDATION.
 

CONNECTORS


MEASURETECH’S EXPERTISE IN MANUFACTURING GLASS TO METAL SEALS HAS BECOME A GREAT ADVANTAGE IN MANUFACTURING HERMETICALLY SEALED MICROWAVE CABLE ASSEMBLIES TO 10-8CC/SEC HELIUM LEAK RATE. THE CONNECTORS ARE MANUFACTURED FROM STAINLESS STEEL OUTER CONDUCTOR AND MOLYBDENUM OR KOVAR AS AN INNER CONDUCTOR.  MEASURETECH’S HIGH TEMPERATURE PREPARATORY LOW LOSS CERAMIC GLASS IS USED TO FABRICATE THE LOWEST LOSS HERMETICALLY SEALED MICROWAVE CONNECTORS.

ATTACHMENT OF CONNECTORS TO CABLE


AT THE PRESENT TIME THE MOST COMMON TECHNIQUE IS USING A HIGH TEMPERATURE SOLDER TO ATTACH THE CONNECTOR TO CABLE, IN THIS CASE CONNECTORS WILL BE GOLD OR NICKEL PLATED PRIOR TO SOLDERING PROCESS.

IN SOME CASES A HIGH TEMPERATURE BRAZE IS USED TO BRAZE A STAINLESS STEEL SLEEVE TO THE CABLE AND THEN WELD THE CONNECTOR TO STAINLESS  STEEL SLEEVE WHICH IS MANUFACTURED FROM THE SAME MATERIAL AS THE CONNECTOR SHELL.

IN THE CASE WHERE COMPOSITE TUBING IS UTILIZED   IN MANUFACTURING THE CABLE, THE CONNECTOR IS DIRECTLY TIG OR LASER WELDED TO THE CABLE JACKET.

QUALITY AND RELIABILITY BUILT IN AND TESTED.

AS A SUPPLIER OF MILITARY EQUIPMENT MEASURETECH HAS MADE A GREAT DEAL OF EFFORT TO PROVIDE THE BEST QUALITY PRODUCT TO MILITARY AND COMMERCIAL CUSTOMERS.  MEASURETECH’S QUALITY SYSTEM CONFORMS TO MIL-I- 45208 WHICH IS CONTINUOUSLY MONITORED BY THE  LOCAL DCMC OFFICE. OUR QUALITY AND DELIVERY RECORDS CAN BE OBTAINED FROM DCMC OFFICE IN VAN NUYS AND OUR CAGE CODE IS 8X117. IN THE CASE OF MICROWAVE CABLE ASSEMBLIES, 100% TESTING OF INSERTION LOSS AND VSWR IS PERFORMED AND DATA PROVIDED TO THE CUSTOMER
MILITARY CUSTOMERS: COMMERCIAL CUSTOMERS:

WARNER ROBINS AIR FORCE BASE, GEORGIA.            
NAVAL INVENTORY CONTROL - MECHANICSBURG.         
NAVAL INVENTORY CONTROL – PHILADELPHIA  
NAVAL SURFACE WARFARE CENTER -  CRANE, INDIANA
NEWARK AIR FORCE BASE, OHIO             
DEFENSE SUPPLY CENTER - RICHMOND. 
DEFENSE SUPPLY CENTER - COLUMBUS.        
REDSTONE ARSENAL, ALABAMA. 

RAYTHEON
NASA
LOCKHEED MARTIN
LUCENT TECHNOLOGIES
BALL AEROSPACE
NORTHROP GRUMMAN
SANDERS BAE


SYSTEM  APPROVALS


F-16 AIRCRAFT
M101 GUN SYSTEM
SPS-40  NAVY SOLID STATE RADAR SYSTEM
NSN6625-01-505-1039
NSN1005-01-053-3714
NSN2520-01-072-9955
NSN2520-01-375-0505
NSN6615-01-185-8951
NSN6615-01-1185-8953
NSN6625-01-249-7818

SPECIFICATION AND TEST DATA FOR  .142 MICROWAVE
CABLE ASSEMBLY
IMPEDANCE:                          50 OHMS +/- 1 OHMH
DIELECTRIC:                      SILICON DIOXIDE
DIELECTRIC   
CONSTANT:                           1.54
DELAY:                                    1.26 NANO SEC/FT
VELOCITY OF
PROPAGATION:                   80%
HERMETICITY:                   1*10-8CC/SEC HELIUM LEAK RATE
CONNECTOR PAIR LOSS
AT 18GHZ:                              .45DB
VSWR AT 18 GHZ:               1.50:1
TEMPERATURE
RANGE:                                  -200C TO 900C
INSERTION LOSS MEASUREMENTS FOR
TYPICAL .142 MICROWAVE CABLE
MEASURED AT ROOM TEMPERATURE 

PHASE STABILITY OF COPPER STAINLESS
STEEL CABLE AS A FUNCTION OF TEMPERATURE 

INSERTION LOSS STABILITY OF COPPER
CABLE AS A FUNCTION OF TEMPERATURE 


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